Sign in to edit your profile (add interests, overview, photo, etc.)
    LBNL Profiles Metrics
    22822 Publications
    3073 Total Profiles
    18 Edited Profiles

    Denes, Peter

    Title
    SchoolLawrence Berkeley National Lab
    DepartmentPhysical Sciences
    Address1 Cyclotron Road
    Berkeley CA 94720
    Phone510/486-6471

       Bibliographic 
       Publications
      Publications listed below are automatically derived from MEDLINE/PubMed and other sources, which might result in incorrect or missing publications. Researchers can sign in to make corrections and additions, or contact us for help.
      List All   |   Timeline
      1. Yu YS, Kim C, Shapiro DA, Farmand M, Qian D, Tyliszczak T, Kilcoyne AL, Celestre R, Marchesini S, Joseph J, Denes P, Warwick T, Strobridge FC, Grey CP, Padmore H, Meng YS, Kostecki R, Cabana J. Dependence on Crystal Size of the Nanoscale Chemical Phase Distribution and Fracture in LixFePO4. Nano Lett. 2015 Jul 8; 15(7):4282-8.
        View in: PubMed
      2. Gautam A, Ophus C, Lançon F, Denes P, Dahmen U. Analysis of grain boundary dynamics using event detection and cumulative averaging. Ultramicroscopy. 2015 Apr; 151:78-84.
        View in: PubMed
      3. Denes P, Schmitt B. Pixel detectors for diffraction-limited storage rings. J Synchrotron Radiat. 2014 Sep; 21(Pt 5):1006-10.
        View in: PubMed
      4. Denes P. Two-dimensional imaging detectors for structural biology with X-ray lasers. Philos Trans R Soc Lond B Biol Sci. 2014 Jul 17; 369(1647):20130334.
        View in: PubMed
      5. Chuang YD, Lee WS, Kung YF, Sorini AP, Moritz B, Moore RG, Patthey L, Trigo M, Lu DH, Kirchmann PS, Yi M, Krupin O, Langner M, Zhu Y, Zhou SY, Reis DA, Huse N, Robinson JS, Kaindl RA, Schoenlein RW, Johnson SL, Först M, Doering D, Denes P, Schlotter WF, Turner JJ, Sasagawa T, Hussain Z, Shen ZX, Devereaux TP. Real-Time Manifestation of Strongly Coupled Spin and Charge Order Parameters in Stripe-Ordered La_{1.75}Sr_{0.25}NiO_{4} Nickelate Crystals Using Time-Resolved Resonant X-Ray Diffraction. Phys Rev Lett. 2013 Mar 22; 110(12):127404.
        View in: PubMed
      6. Doering D, Chuang YD, Andresen N, Chow K, Contarato D, Cummings C, Domning E, Joseph J, Pepper JS, Smith B, Zizka G, Ford C, Lee WS, Weaver M, Patthey L, Weizeorick J, Hussain Z, Denes P. Development of a compact fast CCD camera and resonant soft x-ray scattering endstation for time-resolved pump-probe experiments. Rev Sci Instrum. 2011 Jul; 82(7):073303.
        View in: PubMed
      7. Dahmen U, Erni R, Radmilovic V, Ksielowski C, Rossell MD, Denes P. Background, status and future of the Transmission Electron Aberration-corrected Microscope project. Philos Trans A Math Phys Eng Sci. 2009 Sep 28; 367(1903):3795-808.
        View in: PubMed
      8. Denes P, Doering D, Padmore HA, Walder JP, Weizeorick J. A fast, direct x-ray detection charge-coupled device. Rev Sci Instrum. 2009 Aug; 80(8):083302.
        View in: PubMed
      9. Kisielowski C, Freitag B, Bischoff M, van Lin H, Lazar S, Knippels G, Tiemeijer P, van der Stam M, von Harrach S, Stekelenburg M, Haider M, Uhlemann S, Müller H, Hartel P, Kabius B, Miller D, Petrov I, Olson EA, Donchev T, Kenik EA, Lupini AR, Bentley J, Pennycook SJ, Anderson IM, Minor AM, Schmid AK, Duden T, Radmilovic V, Ramasse QM, Watanabe M, Erni R, Stach EA, Denes P, Dahmen U. Detection of single atoms and buried defects in three dimensions by aberration-corrected electron microscope with 0.5-A information limit. Microsc Microanal. 2008 Oct; 14(5):469-77.
        View in: PubMed
      10. Milazzo AC, Leblanc P, Duttweiler F, Jin L, Bouwer JC, Peltier S, Ellisman M, Bieser F, Matis HS, Wieman H, Denes P, Kleinfelder S, Xuong NH. Active pixel sensor array as a detector for electron microscopy. Ultramicroscopy. 2005 Sep; 104(2):152-9.
        View in: PubMed
      Peter's Networks
      Related Concepts
      Derived automatically from this person's publications.
      _
      Co-Authors at LBL
      People in Profiles who have published with this person.
      _
      Same Department
      Back to TOP