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    Goldberg, Kenneth

    Address1 Cyclotron Road
    Berkeley CA 94720
    Phone510/495-2261
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      Publications listed below are automatically derived from MEDLINE/PubMed and other sources, which might result in incorrect or missing publications. Researchers can login to make corrections and additions, or contact us for help.
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      1. Goldberg K, Yashchuk VV. Optimized mirror shape tuning using beam weightings based on distance, angle of incidence, reflectivity, and power. Rev Sci Instrum. 2016 05; 87(5):051805. PMID: 27250372.
        View in: PubMed
      2. Assoufid L, Goldberg K, Yashchuk VV. Preface: The 5th International Workshop on X-ray Mirror Design, Fabrication, and Metrology. Rev Sci Instrum. 2016 05; 87(5):051701. PMID: 27250367.
        View in: PubMed
      3. Yamazoe K, Mochi I, Goldberg K. Gradient descent algorithm applied to wavefront retrieval from through-focus images by an extreme ultraviolet microscope with partially coherent source. J Opt Soc Am A Opt Image Sci Vis. 2014 Dec 01; 31(12):B34-43. PMID: 25606778.
        View in: PubMed
      4. Naulleau PP, Anderson CN, Anderson EH, Andreson N, Chao W, Choi C, Goldberg K, Gullikson EM, Kim SS, Lee D, Miyakawa R, Park J, Rekawa S, Salmassi F. Electro-optical system for scanning microscopy of extreme ultraviolet masks with a high harmonic generation source. Opt Express. 2014 Aug 25; 22(17):20144-54. PMID: 25321224.
        View in: PubMed
      5. Naulleau PP, Mochi I, Goldberg K. Optical modeling of Fresnel zoneplate microscopes. Appl Opt. 2011 Jul 10; 50(20):3678-84. PMID: 21743581.
        View in: PubMed
      6. Brizuela F, Carbajo S, Sakdinawat A, Alessi D, Martz DH, Wang Y, Luther B, Goldberg K, Mochi I, Attwood DT, La Fontaine B, Rocca JJ, Menoni CS. Extreme ultraviolet laser-based table-top aerial image metrology of lithographic masks. Opt Express. 2010 Jul 05; 18(14):14467-73. PMID: 20639931.
        View in: PubMed
      7. Brizuela F, Wang Y, Brewer CA, Pedaci F, Chao W, Anderson EH, Liu Y, Goldberg K, Naulleau P, Wachulak P, Marconi MC, Attwood DT, Rocca JJ, Menoni CS. Microscopy of extreme ultraviolet lithography masks with 13.2 nm tabletop laser illumination. Opt Lett. 2009 Feb 01; 34(3):271-3. PMID: 19183628.
        View in: PubMed
      8. Duindam V, Alterovitz R, Sastry S, Goldberg K. Screw-Based Motion Planning for Bevel-Tip Flexible Needles in 3D Environments with Obstacles. IEEE Int Conf Robot Autom. 2008 May 19; 2483-2488. PMID: 22146911.
        View in: PubMed
      9. Naulleau PP, Cain JP, Goldberg K. Lithographic characterization of the spherical error in an extreme-ultraviolet optic by use of a programmable pupil-fill illuminator. Appl Opt. 2006 Mar 20; 45(9):1957-63. PMID: 16579565.
        View in: PubMed
      10. Mercère P, Zeitoun P, Idir M, Le Pape S, Douillet D, Levecq X, Dovillaire G, Bucourt S, Goldberg K, Naulleau PP, Rekawa S. Hartmann wave-front measurement at 13.4 nm with lambdaEUV/120 accuracy. Opt Lett. 2003 Sep 01; 28(17):1534-6. PMID: 12956370.
        View in: PubMed
      11. Naulleau PP, Goldberg K, Batson P, Bokor J, Denham P, Rekawa S. Fourier-synthesis custom-coherence illuminator for extreme ultraviolet microfield lithography. Appl Opt. 2003 Feb 10; 42(5):820-6. PMID: 12593485.
        View in: PubMed
      12. Goldberg K, Naulleau P, Bokor J. Fourier transform interferometer alignment method. Appl Opt. 2002 Aug 01; 41(22):4477-83. PMID: 12153074.
        View in: PubMed
      13. Chang C, Anderson E, Naulleau P, Gullikson E, Goldberg K, Attwood D. Direct measurement of index of refraction in the extreme-ultraviolet wavelength region with a novel interferometer. Opt Lett. 2002 Jun 15; 27(12):1028-30. PMID: 18026354.
        View in: PubMed
      14. Goldberg K, Geary K. Wave-front measurement errors from restricted concentric subdomains. J Opt Soc Am A Opt Image Sci Vis. 2001 Sep; 18(9):2146-52. PMID: 11551047.
        View in: PubMed
      15. Naulleau PP, Goldberg K, Batson PJ, Jeong S, Underwood JH. Tolerancing of diffraction-limited Kirkpatrick-Baez synchrotron beamline optics for extreme-ultraviolet metrology. Appl Opt. 2001 Aug 01; 40(22):3703-9. PMID: 18360402.
        View in: PubMed
      16. Goldberg K, Bokor J. Fourier-transform method of phase-shift determination. Appl Opt. 2001 Jun 10; 40(17):2886-94. PMID: 18357307.
        View in: PubMed
      17. Lee SH, Naulleau P, Goldberg K, Cho CH, Jeong S, Bokor J. Extreme-ultraviolet lensless Fourier-transform holography. Appl Opt. 2001 Jun 01; 40(16):2655-61. PMID: 18357280.
        View in: PubMed
      18. Lee SH, Naulleau P, Goldberg K, Piao F, Oldham W, Bokar J. Phase-shifting point-diffraction interferometry at 193 nm. Appl Opt. 2000 Nov 01; 39(31):5768-72. PMID: 18354576.
        View in: PubMed
      19. Naulleau P, Goldberg K, Gullikson EM, Bokor J. At-wavelength, system-level flare characterization of extreme-ultraviolet optical systems. Appl Opt. 2000 Jun 10; 39(17):2941-7. PMID: 18345220.
        View in: PubMed
      20. Naulleau PP, Goldberg K, Lee SH, Chang C, Attwood D, Bokor J. Extreme-ultraviolet phase-shifting point-diffraction interferometer: a wave-front metrology tool with subangstrom reference-wave accuracy. Appl Opt. 1999 Dec 11; 38(35):7252-63. PMID: 18324274.
        View in: PubMed
      21. Naulleau PP, Goldberg K. Dual-domain point diffraction interferometer. Appl Opt. 1999 Jun 01; 38(16):3523-33. PMID: 18319953.
        View in: PubMed
      22. Tejnil E, Goldberg K, Bokor J. Phase effects owing to multilayer coatings in a two-mirror extreme-ultraviolet schwarzschild objective. Appl Opt. 1998 Dec 01; 37(34):8021-9. PMID: 18301694.
        View in: PubMed
      23. Medecki H, Tejnil E, Goldberg K, Bokor J. Phase-shifting point diffraction interferometer. Opt Lett. 1996 Oct 01; 21(19):1526-8. PMID: 19881713.
        View in: PubMed

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