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    Gullikson, Eric

    TitlePhysicist Staff Sci/Engr
    SchoolLawrence Berkeley National Lab
    DepartmentMaterials Sciences
    Address1 Cyclotron Road
    Berkeley CA 94720
    Phone510/486-6646
    vCardDownload vCard

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      Publications listed below are automatically derived from MEDLINE/PubMed and other sources, which might result in incorrect or missing publications. Researchers can login to make corrections and additions, or contact us for help.
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      1. Huber SP, Medvedev VV, Gullikson E, Padavala B, Edgar JH, van de Kruijs RW, Bijkerk F, Prendergast D. Determining crystal phase purity in c-BP through X-ray absorption spectroscopy. Phys Chem Chem Phys. 2017 Feb 02. PMID: 28149999.
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      2. Chuang YD, Shao YC, Cruz A, Hanzel K, Brown A, Frano A, Qiao R, Smith B, Domning E, Huang SW, Wray LA, Lee WS, Shen ZX, Devereaux TP, Chiou JW, Pong WF, Yashchuk VV, Gullikson E, Reininger R, Yang W, Guo J, Duarte R, Hussain Z. Modular soft x-ray spectrometer for applications in energy sciences and quantum materials. Rev Sci Instrum. 2017 Jan; 88(1):013110. PMID: 28147697.
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      3. Moore AS, Benstead J, Ahmed MF, Morton J, Guymer TM, Soufli R, Pardini T, Hibbard RL, Bailey CG, Bell PM, Hau-Riege S, Bedzyk M, Shoup MJ, Regan SP, Agliata T, Jungquist R, Schmidt DW, Kot LB, Garbett WJ, Rubery MS, Skidmore JW, Gullikson E, Salmassi F. Two-color spatial and temporal temperature measurements using a streaked soft x-ray imager. Rev Sci Instrum. 2016 Nov; 87(11):11E313. PMID: 27910456.
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      4. Voronov DL, Salmassi F, Meyer-Ilse J, Gullikson E, Warwick T, Padmore HA. Refraction effects in soft x-ray multilayer blazed gratings. Opt Express. 2016 May 30; 24(11):11334-44. PMID: 27410064.
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      5. Benstead J, Moore AS, Ahmed MF, Morton J, Guymer TM, Soufli R, Pardini T, Hibbard RL, Bailey CG, Bell PM, Hau-Riege S, Bedzyk M, Shoup MJ, Reagan S, Agliata T, Jungquist R, Schmidt DW, Kot LB, Garbett WJ, Rubery MS, Skidmore JW, Gullikson E, Salmassi F. A new streaked soft x-ray imager for the National Ignition Facility. Rev Sci Instrum. 2016 May; 87(5):055110. PMID: 27250473.
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      6. Ichimaru S, Hatayama M, Ohchi T, Gullikson E, Oku S. Performance of a ruthenium beam separator used to separate soft x rays from light generated by a high-order harmonic light source. Appl Opt. 2016 Feb 10; 55(5):984-8. PMID: 26906363.
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      7. Ichimaru S, Takenaka H, Namikawa K, Gullikson E, Maruyama M, Oku S. Demonstration of the high collection efficiency of a broadband Mo/Si multilayer mirror with a graded multilayer coating on an ellipsoidal substrate. Rev Sci Instrum. 2015 Sep; 86(9):093106. PMID: 26429428.
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      8. Windt DL, Gullikson E. Pd/B4C/Y multilayer coatings for extreme ultraviolet applications near 10??nm wavelength. Appl Opt. 2015 Jun 20; 54(18):5850-60. PMID: 26193039.
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      9. Karslioglu O, Nemšák S, Zegkinoglou I, Shavorskiy A, Hartl M, Salmassi F, Gullikson E, Ng ML, Rameshan Ch, Rude B, Bianculli D, Cordones AA, Axnanda S, Crumlin EJ, Ross PN, Schneider CM, Hussain Z, Liu Z, Fadley CS, Bluhm H. Aqueous solution/metal interfaces investigated in operando by photoelectron spectroscopy. Faraday Discuss. 2015; 180:35-53. PMID: 25912462.
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      10. Nemšák S, Shavorskiy A, Karslioglu O, Zegkinoglou I, Rattanachata A, Conlon CS, Keqi A, Greene PK, Burks EC, Salmassi F, Gullikson E, Yang SH, Liu K, Bluhm H, Fadley CS. Concentration and chemical-state profiles at heterogeneous interfaces with sub-nm accuracy from standing-wave ambient-pressure photoemission. Nat Commun. 2014; 5:5441. PMID: 25399688.
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      11. Guggenmos A, Radünz S, Rauhut R, Hofstetter M, Venkatesan S, Wochnik A, Gullikson E, Fischer S, Nickel B, Scheu C, Kleineberg U. Ion polished Cr/Sc attosecond multilayer mirrors for high water window reflectivity. Opt Express. 2014 Nov 3; 22(22):26526-36. PMID: 25401804.
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      12. Naulleau PP, Anderson CN, Anderson EH, Andreson N, Chao W, Choi C, Goldberg KA, Gullikson E, Kim SS, Lee D, Miyakawa R, Park J, Rekawa S, Salmassi F. Electro-optical system for scanning microscopy of extreme ultraviolet masks with a high harmonic generation source. Opt Express. 2014 Aug 25; 22(17):20144-54. PMID: 25321224.
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      13. Voronov DL, Gullikson E, Salmassi F, Warwick T, Padmore HA. Enhancement of diffraction efficiency via higher-order operation of a multilayer blazed grating. Opt Lett. 2014 Jun 1; 39(11):3157-60. PMID: 24876001.
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      14. Jonah EO, Härting M, Gullikson E, Aquila A, Britton DT. Investigation of surface topology of printed nanoparticle layers using wide-angle low-Q scattering. J Synchrotron Radiat. 2014 May 1; 21(Pt 3):547-53. PMID: 24763644.
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      15. Wang Y, Yin L, Wang S, Marconi MC, Dunn J, Gullikson E, Rocca JJ. Single-shot soft x-ray laser linewidth measurement using a grating interferometer. Opt Lett. 2013 Dec 1; 38(23):5004-7. PMID: 24281495.
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      16. Zhang B, Seaberg MD, Adams DE, Gardner DF, Shanblatt ER, Shaw JM, Chao W, Gullikson E, Salmassi F, Kapteyn HC, Murnane MM. Full field tabletop EUV coherent diffractive imaging in a transmission geometry. Opt Express. 2013 Sep 23; 21(19):21970-80. PMID: 24104090.
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      17. Guggenmos A, Rauhut R, Hofstetter M, Hertrich S, Nickel B, Schmidt J, Gullikson E, Seibald M, Schnick W, Kleineberg U. Aperiodic CrSc multilayer mirrors for attosecond water window pulses. Opt Express. 2013 Sep 23; 21(19):21728-40. PMID: 24104067.
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      18. Sobierajski R, Loch RA, van de Kruijs RW, Louis E, von Blanckenhagen G, Gullikson E, Siewert F, Wawro A, Bijkerk F. Mo/Si multilayer-coated amplitude-division beam splitters for XUV radiation sources. J Synchrotron Radiat. 2013 Mar; 20(Pt 2):249-57. PMID: 23412481.
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      19. Fernández-Perea M, Soufli R, Robinson JC, Rodríguez-De Marcos L, Méndez JA, Larruquert JI, Gullikson E. Triple-wavelength, narrowband Mg/SiC multilayers with corrosion barriers and high peak reflectance in the 25-80 nm wavelength region. Opt Express. 2012 Oct 8; 20(21):24018-29. PMID: 23188369.
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      20. Schneider MB, Meezan NB, Alvarez SS, Alameda J, Baker S, Bell PM, Bradley DK, Callahan DA, Celeste JR, Dewald EL, Dixit SN, Döppner T, Eder DC, Edwards MJ, Fernandez-Perea M, Gullikson E, Haugh MJ, Hau-Riege S, Hsing W, Izumi N, Jones OS, Kalantar DH, Kilkenny JD, Kline JL, Kyrala GA, Landen OL, London RA, MacGowan BJ, MacKinnon AJ, McCarville TJ, Milovich JL, Mirkarimi P, Moody JD, Moore AS, Myers MD, Palma EA, Palmer N, Pivovaroff MJ, Ralph JE, Robinson J, Soufli R, Suter LJ, Teruya AT, Thomas CA, Town RP, Vernon SP, Widmann K, Young BK. Soft x-ray images of the laser entrance hole of ignition hohlraums. Rev Sci Instrum. 2012 Oct; 83(10):10E525. PMID: 23127032.
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      21. Gardner DF, Zhang B, Seaberg MD, Martin LS, Adams DE, Salmassi F, Gullikson E, Kapteyn H, Murnane M. High numerical aperture reflection mode coherent diffraction microscopy using off-axis apertured illumination. Opt Express. 2012 Aug 13; 20(17):19050-9. PMID: 23038545.
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      22. Voronov DL, Anderson EH, Gullikson E, Salmassi F, Warwick T, Yashchuk VV, Padmore HA. Ultra-high efficiency multilayer blazed gratings through deposition kinetic control. Opt Lett. 2012 May 15; 37(10):1628-30. PMID: 22627518.
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      23. Soufli R, Fernández-Perea M, Baker SL, Robinson JC, Gullikson E, Heimann P, Yashchuk VV, McKinney WR, Schlotter WF, Rowen M. Development and calibration of mirrors and gratings for the soft x-ray materials science beamline at the Linac Coherent Light Source free-electron laser. Appl Opt. 2012 Apr 20; 51(12):2118-28. PMID: 22534924.
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      24. Bajt S, Chapman HN, Aquila A, Gullikson E. High-efficiency x-ray gratings with asymmetric-cut multilayers. J Opt Soc Am A Opt Image Sci Vis. 2012 Mar 1; 29(3):216-30. PMID: 22472750.
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      25. Natsume Y, Kohno T, Minakata T, Konishi T, Gullikson E, Muramatsu Y. Chemical-state analysis of organic semiconductors using soft X-ray absorption spectroscopy combined with first-principles calculation. J Phys Chem A. 2012 Feb 16; 116(6):1527-31. PMID: 22217144.
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      26. Cho H, Strader ML, Hong K, Jamula L, Gullikson E, Kim TK, de Groot FM, McCusker JK, Schoenlein RW, Husea N. Ligand-field symmetry effects in Fe(II) polypyridyl compounds probed by transient X-ray absorption spectroscopy. Faraday Discuss. 2012; 157:463-74; discussion 475-500. PMID: 23230783.
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      27. Maruyama J, Hasegawa T, Amano T, Muramatsu Y, Gullikson E, Orikasa Y, Uchimoto Y. Pore development in carbonized hemoglobin by concurrently generated MgO template for activity enhancement as fuel cell cathode catalyst. ACS Appl Mater Interfaces. 2011 Dec; 3(12):4837-43. PMID: 22091636.
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      28. Kaiser AM, Gray AX, Conti G, Son J, Greer A, Perona A, Rattanachata A, Saw AY, Bostwick A, Yang S, Yang SH, Gullikson E, Kortright JB, Stemmer S, Fadley CS. Suppression of near-Fermi level electronic states at the interface in a LaNiO3/SrTiO3 superlattice. Phys Rev Lett. 2011 Sep 9; 107(11):116402. PMID: 22026689.
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      29. Loch RA, Dubrouil A, Sobierajski R, Descamps D, Fabre B, Lidon P, van de Kruijs RW, Boekhout F, Gullikson E, Gaudin J, Louis E, Bijkerk F, Mével E, Petit S, Constant E, Mairesse Y. Phase characterization of the reflection on an extreme UV multilayer: comparison between attosecond metrology and standing wave measurements. Opt Lett. 2011 Sep 1; 36(17):3386-8. PMID: 21886219.
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      30. Corso AJ, Zuppella P, Nicolosi P, Windt DL, Gullikson E, Pelizzo MG. Capped Mo/Si multilayers with improved performance at 30.4 nm for future solar missions. Opt Express. 2011 Jul 18; 19(15):13963-73. PMID: 21934757.
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      31. Heilmann RK, Ahn M, Bruccoleri A, Chang CH, Gullikson E, Mukherjee P, Schattenburg ML. Diffraction efficiency of 200-nm-period critical-angle transmission gratings in the soft x-ray and extreme ultraviolet wavelength bands. Appl Opt. 2011 Apr 1; 50(10):1364-73. PMID: 21460902.
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      32. Voronov DL, Anderson EH, Cambie R, Cabrini S, Dhuey SD, Goray LI, Gullikson E, Salmassi F, Warwick T, Yashchuk VV, Padmore HA. A 10,000 groove/mm multilayer coated grating for EUV spectroscopy. Opt Express. 2011 Mar 28; 19(7):6320-5. PMID: 21451658.
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      33. Hofstetter M, Schultze M, Fiess M, Dennhardt B, Guggenmos A, Gagnon J, Yakovlev VS, Goulielmakis E, Kienberger R, Gullikson E, Krausz F, Kleineberg U. Attosecond dispersion control by extreme ultraviolet multilayer mirrors. Opt Express. 2011 Jan 31; 19(3):1767-76. PMID: 21368991.
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      34. Sobierajski R, Bruijn S, Khorsand AR, Louis E, van de Kruijs RW, Burian T, Chalupsky J, Cihelka J, Gleeson A, Grzonka J, Gullikson E, Hajkova V, Hau-Riege S, Juha L, Jurek M, Klinger D, Krzywinski J, London R, Pelka JB, Plocinski T, Rasinski M, Tiedtke K, Toleikis S, Vysin L, Wabnitz H, Bijkerk F. Damage mechanisms of MoN/SiN multilayer optics for next-generation pulsed XUV light sources. Opt Express. 2011 Jan 3; 19(1):193-205. PMID: 21263557.
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      35. Voronov DL, Ahn M, Anderson EH, Cambie R, Chang CH, Gullikson E, Heilmann RK, Salmassi F, Schattenburg ML, Warwick T, Yashchuk VV, Zipp L, Padmore HA. High-efficiency 5000 lines/mm multilayer-coated blazed grating for extreme ultraviolet wavelengths. Opt Lett. 2010 Aug 1; 35(15):2615-7. PMID: 20680076.
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      36. Khorsand AR, Sobierajski R, Louis E, Bruijn S, van Hattum ED, van de Kruijs RW, Jurek M, Klinger D, Pelka JB, Juha L, Burian T, Chalupsky J, Cihelka J, Hajkova V, Vysin L, Jastrow U, Stojanovic N, Toleikis S, Wabnitz H, Tiedtke K, Sokolowski-Tinten K, Shymanovich U, Krzywinski J, Hau-Riege S, London R, Gleeson A, Gullikson E, Bijkerk F. Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure. Opt Express. 2010 Jan 18; 18(2):700-12. PMID: 20173890.
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      37. Aquila A, Salmassi F, Liu Y, Gullikson E. Tri-material multilayer coatings with high reflectivity and wide bandwidth for 25 to 50 nm extreme ultraviolet light. Opt Express. 2009 Nov 23; 17(24):22102-7. PMID: 19997456.
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      38. Hatayama M, Takenaka H, Gullikson E, Suda A, Midorikawa K. Broadband extreme ultraviolet multilayer mirror for supercontinuum light at a photon energy of 35-65 eV. Appl Opt. 2009 Oct 10; 48(29):5464-6. PMID: 19823227.
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      39. Artyukov I, Bugayev Y, Devizenko O, Gullikson E, Kondratenko V, Vinogradov A. X-ray Schwarzschild objective for the carbon window (lambda approximately 4.5 nm). Opt Lett. 2009 Oct 1; 34(19):2930-2. PMID: 19794771.
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      40. Fuchs O, Weinhardt L, Blum M, Weigand M, Umbach E, Bär M, Heske C, Denlinger J, Chuang YD, McKinney W, Hussain Z, Gullikson E, Jones M, Batson P, Nelles B, Follath R. High-resolution, high-transmission soft x-ray spectrometer for the study of biological samples. Rev Sci Instrum. 2009 Jun; 80(6):063103. PMID: 19566192.
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      41. Soufli R, Aquila AL, Salmassi F, Fernández-Perea M, Gullikson E. Optical constants of magnetron-sputtered boron carbide thin films from photoabsorption data in the range 30 to 770 eV. Appl Opt. 2008 Sep 1; 47(25):4633-9. PMID: 18758535.
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      42. Eriksson F, Ghafoor N, Schäfers F, Gullikson E, Aouadi S, Rohde S, Hultman L, Birch J. Atomic scale interface engineering by modulated ion-assisted deposition applied to soft x-ray multilayer optics. Appl Opt. 2008 Aug 10; 47(23):4196-204. PMID: 18690259.
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      43. Naulleau PP, Gullikson E, Aquila A, George S, Niakoula D. Absolute sensitivity calibration of extreme ultraviolet photoresists. Opt Express. 2008 Jul 21; 16(15):11519-24. PMID: 18648473.
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      44. Goulielmakis E, Schultze M, Hofstetter M, Yakovlev VS, Gagnon J, Uiberacker M, Aquila AL, Gullikson E, Attwood DT, Kienberger R, Krausz F, Kleineberg U. Single-cycle nonlinear optics. Science. 2008 Jun 20; 320(5883):1614-7. PMID: 18566281.
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      45. Heilmann RK, Ahn M, Gullikson E, Schattenburg ML. Blazed high-efficiency x-ray diffraction via transmission through arrays of nanometer-scale mirrors. Opt Express. 2008 Jun 9; 16(12):8658-69. PMID: 18545579.
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      46. Aquila A, Salmassi F, Gullikson E. Metrologies for the phase characterization of attosecond extreme ultraviolet optics. Opt Lett. 2008 Mar 1; 33(5):455-7. PMID: 18311290.
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      47. Fernández-Perea M, Larruquert JI, Aznárez JA, Méndez JA, Vidal-Dasilva M, Gullikson E, Aquila A, Soufli R, Fierro JL. Optical constants of electron-beam evaporated boron films in the 6.8-900 eV photon energy range. J Opt Soc Am A Opt Image Sci Vis. 2007 Dec; 24(12):3800-7. PMID: 18059933.
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      48. Soufli R, Hudyma RM, Spiller E, Gullikson E, Schmidt MA, Robinson JC, Baker SL, Walton CC, Taylor JS. Sub-diffraction-limited multilayer coatings for the 0.3 numerical aperture micro-exposure tool for extreme ultraviolet lithography. Appl Opt. 2007 Jun 20; 46(18):3736-46. PMID: 17538670.
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      49. Soufli R, Baker SL, Windt DL, Gullikson E, Robinson JC, Podgorski WA, Golub L. Atomic force microscopy characterization of Zerodur mirror substrates for the extreme ultraviolet telescopes aboard NASA's Solar Dynamics Observatory. Appl Opt. 2007 Jun 1; 46(16):3156-63. PMID: 17514269.
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      50. Naulleau PP, Salmassi F, Gullikson E, Liddle JA. Design and fabrication of a high-efficiency extreme-ultraviolet binary phase-only computer-generated hologram. Appl Opt. 2007 May 10; 46(14):2581-5. PMID: 17446905.
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      51. Hau-Riege SP, Chapman HN, Krzywinski J, Sobierajski R, Bajt S, London RA, Bergh M, Caleman C, Nietubyc R, Juha L, Kuba J, Spiller E, Baker S, Bionta R, Sokolowski Tinten K, Stojanovic N, Kjornrattanawanich B, Gullikson E, Plönjes E, Toleikis S, Tschentscher T. Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter. Phys Rev Lett. 2007 Apr 6; 98(14):145502. PMID: 17501285.
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      52. Aquila AL, Salmassi F, Dollar F, Liu Y, Gullikson E. Developments in realistic design for aperiodic Mo/Si multilayer mirrors. Opt Express. 2006 Oct 16; 14(21):10073-8. PMID: 19529401.
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      53. Ishino M, Heimann PA, Sasai H, Hatayama M, Takenaka H, Sano K, Gullikson E, Koike M. Development of multilayer laminar-type diffraction gratings to achieve high diffraction efficiencies in the 1-8 keV energy region. Appl Opt. 2006 Sep 10; 45(26):6741-5. PMID: 16926907.
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      54. Yashchuk VV, Gullikson E, Howells MR, Irick SC, MacDowell AA, McKinney WR, Salmassi F, Warwick T, Metz JP, Tonnessen TW. Surface roughness of stainless-steel mirrors for focusing soft x rays. Appl Opt. 2006 Jul 10; 45(20):4833-42. PMID: 16807589.
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      55. Salmassi F, Naulleau PP, Gullikson E. Spin-on-glass coatings for the generation of superpolished substrates for use in the extreme-ultraviolet region. Appl Opt. 2006 Apr 10; 45(11):2404-8. PMID: 16623236.
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      56. Nachimuthu P, Thevuthasan S, Adams EM, Weber WJ, Begg BD, Mun BS, Shuh DK, Lindle DW, Gullikson E, Perera RC. Near-edge X-ray absorption fine structure study of disordering in Gd2(Ti1-yZry)2O7 pyrochlores. J Phys Chem B. 2005 Feb 3; 109(4):1337-9. PMID: 16851100.
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      57. Barty A, Hau-Riege S, Stearns D, Clift M, Mirkarimi P, Gullikson E, Chapman H, Sweeney D. Repairing amplitude defects in multilayer-coated extreme-ultraviolet lithography reticles by use of a focused ion beam. Appl Opt. 2004 Dec 20; 43(36):6545-56. PMID: 15646775.
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      58. Naulleau PP, Liddle JA, Salmassi F, Anderson EH, Gullikson E. Design, fabrication, and characterization of high-efficiency extreme-ultraviolet diffusers. Appl Opt. 2004 Oct 1; 43(28):5323-9. PMID: 15495422.
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      59. Eriksson F, Johansson GA, Hertz HM, Gullikson E, Kreissig U, Birch J. 14.5% near-normal incidence reflectance of Cr/Sc x-ray multilayer mirrors for the water window. Opt Lett. 2003 Dec 15; 28(24):2494-6. PMID: 14690125.
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      60. Gibson EA, Paul A, Wagner N, Tobey R, Gaudiosi D, Backus S, Christov IP, Aquila A, Gullikson E, Attwood DT, Murnane MM, Kapteyn HC. Coherent soft x-ray generation in the water window with quasi-phase matching. Science. 2003 Oct 3; 302(5642):95-8. PMID: 14526077.
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      61. Bajt S, Chapman HN, Nguyen N, Alameda J, Robinson JC, Malinowski M, Gullikson E, Aquila A, Tarrio C, Grantham S. Design and performance of capping layers for extreme-ultraviolet multilayer mirrors. Appl Opt. 2003 Oct 1; 42(28):5750-8. PMID: 14528939.
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      62. Muramatsu Y, Kaneyoshi T, Gullikson E, Perera RC. Angle-resolved soft X-ray emission and absorption spectroscopy of hexagonal boron nitride. Spectrochim Acta A Mol Biomol Spectrosc. 2003 Jul; 59(9):1951-7. PMID: 12788449.
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      63. Spiller E, Baker SL, Mirkarimi PB, Sperry V, Gullikson E, Stearns DG. High-performance Mo-Si multilayer coatings for extreme-ultraviolet lithography by ion-beam deposition. Appl Opt. 2003 Jul 1; 42(19):4049-58. PMID: 12868847.
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      64. Windt DL, Gullikson E, Walton CC. Normal-incidence reflectance of optimized W /B(4) C x-ray multilayers in the range 1.4 nm < l > 2.4 nm. Opt Lett. 2002 Dec 15; 27(24):2212-4. PMID: 18033486.
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      65. Chang C, Anderson E, Naulleau P, Gullikson E, Goldberg K, Attwood D. Direct measurement of index of refraction in the extreme-ultraviolet wavelength region with a novel interferometer. Opt Lett. 2002 Jun 15; 27(12):1028-30. PMID: 18026354.
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      66. Hambach D, Schneider G, Gullikson E. Efficient high-order diffraction of extreme-ultraviolet light and soft x-rays by nanostructured volume gratings. Opt Lett. 2001 Aug 1; 26(15):1200-2. PMID: 18049562.
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      67. Muramatsu Y, Ueno Y, Sasaki TA, Gullikson E, Perera RC. Experimental technique for radiative-process-resolved X-ray absorption spectroscopy at the inner-shell excitation thresholds. J Synchrotron Radiat. 2001 Mar 1; 8(Pt 2):369-71. PMID: 11512783.
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      68. Naulleau PP, Cho CH, Gullikson E, Bokor J. Transmission phase gratings for EUV interferometry. J Synchrotron Radiat. 2000 Nov 1; 7(Pt 6):405-10. PMID: 16609228.
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      69. Naulleau P, Goldberg KA, Gullikson E, Bokor J. At-wavelength, system-level flare characterization of extreme-ultraviolet optical systems. Appl Opt. 2000 Jun 10; 39(17):2941-7. PMID: 18345220.
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      70. Yamazaki T, Gullikson E, Miyata N, Koike M, Harada Y, Mrowka S, Kleineberg U, Underwood JH, Yanagihara MM, Sano K. Comparison of mechanically ruled versus holographically varied line-spacing gratings for a soft-x-ray flat-field spectrograph. Appl Opt. 1999 Jul 1; 38(19):4001-3. PMID: 18323875.
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      71. Soufli R, Gullikson E. Absolute Photoabsorption Measurements of Molybdenum in the Range 60-930 eV for Optical Constant Determination. Appl Opt. 1998 Apr 1; 37(10):1713-9. PMID: 18273078.
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      72. Soufli R, Gullikson E. Reflectance measurements on clean surfaces for the determination of optical constants of silicon in the extreme ultraviolet-soft-x-ray region. Appl Opt. 1997 Aug 1; 36(22):5499-507. PMID: 18259372.
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      73. van Loevezijn P, Schlatmann R, Verhoeven J, van Tiggelen BA, Gullikson E. Numerical and experimental study of disordered multilayers for broadband x-ray reflection. Appl Opt. 1996 Jul 1; 35(19):3614-9. PMID: 21102755.
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      74. Gullikson E, Gramsch E, Szawlowski M. Large-area avalanche photodiodes for the detection of soft x rays. Appl Opt. 1995 Aug 1; 34(22):4662-8. PMID: 21052299.
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      75. Skulina KM, Alford CS, Bionta RM, Makowiecki DM, Gullikson E, Soufli R, Kortright JB, Underwood JH. Molybdenum/beryllium multilayer mirrors for normal incidence in the extreme ultraviolet. Appl Opt. 1995 Jul 1; 34(19):3727-30. PMID: 21052194.
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      76. Kortright JB, Gullikson E, Denham PE. Masked deposition techniques for achieving multilayer period variations required for short-wavelength (68-A) soft-x-ray imaging optics. Appl Opt. 1993 Dec 1; 32(34):6961-8. PMID: 20856552.
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      77. Underwood JH, Gullikson E, Nguyen K. Tarnishing of Mo/Si multilayer x-ray mirrors. Appl Opt. 1993 Dec 1; 32(34):6985-90. PMID: 20856556.
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      78. Gullikson E, Underwood JH, Batson PC, Nikitin V. A Soft X-Ray/EUV Reflectometer Based on a Laser Produced Plasma Source. J Xray Sci Technol. 1992 Jan 1; 3(4):283-99. PMID: 21307445.
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      79. Henke BL, Gullikson E, Kerner J, Oren AL, Blake RL. Design and Characterization of X-Ray Multilayer Analyzers for the 50-1000 eV Region. J Xray Sci Technol. 1990 Jan 1; 2(1):17-80. PMID: 21307415.
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